An edition of Advanced Scanning Electron Microscopy and X-Ray Microanalysis (1986)

Advanced Scanning Electron Microscopy and X-Ray Microanalysis

by , , , , and

Cover of: Advanced Scanning Electron Microscopy and X-Ray Microanalysis by Patrick Echlin, C. E. Fiori, Joseph Goldstein, David C. Joy, Dale E. Newbury
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Last edited by ImportBot
February 27, 2022 | History
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An edition of Advanced Scanning Electron Microscopy and X-Ray Microanalysis (1986)

Advanced Scanning Electron Microscopy and X-Ray Microanalysis

by , , , , and

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Publish Date
Publisher
Springer US
Language
German

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Book Details

Edition Notes

Lizenzpflichtig

Langzeitarchivierung gewährleistet LZA

Published in
Boston, MA

Classifications

Dewey Decimal Class
530
Library of Congress
RB1-214

The Physical Object

Format
Elektronische Ressource
Pagination
Online-Ressource.

Edition Identifiers

Open Library
OL27014671M
ISBN 10
1475790279
ISBN 13
9781475790276
OCLC/WorldCat
860358579

Work Identifiers

Work ID
OL19824034W

Source records

Internet Archive item record
Better World Books record

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Download catalog record: RDF / JSON
February 27, 2022 Edited by ImportBot import existing book
June 28, 2019 Created by MARC Bot import new book