An edition of Advanced Scanning Electron Microscopy and X-Ray Microanalysis (2013)

Advanced Scanning Electron Microscopy and X-Ray Microanalysis

by , , and

Cover of: Advanced Scanning Electron Microscopy and X-Ray Microanalysis by Patrick Echlin, C.E. Fiori, Joseph Goldstein, Patrick Echlin, C. E. Fiori, Joseph Goldstein, David C. Joy, Dale E. Newbury
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An edition of Advanced Scanning Electron Microscopy and X-Ray Microanalysis (2013)

Advanced Scanning Electron Microscopy and X-Ray Microanalysis

by , , and

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Publish Date
Publisher
Springer
Language
English
Pages
466

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Book Details

Classifications

Library of Congress
RB1-214

The Physical Object

Pagination
xii, 454
Number of pages
466
Weight
0.692

Edition Identifiers

Open Library
OL37169534M
ISBN 13
9781475790290

Work Identifiers

Work ID
OL20782768W

Source records

Better World Books record
amazon.com record

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May 22, 2020 Created by ImportBot import new book