An edition of Scanning Microscopies 2012
(2012)
Scanning Microscopies 2012
Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
by Michael T. Postek, Dale E. Newbury, S. Frank Platek, David C. Joy, and Tim K. Maugel
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Scanning electron microscopes| Edition | Availability |
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1
Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
2012, SPIE
in English
0819490563 9780819490568
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| August 3, 2020 | Created by ImportBot | import new book |