An edition of Transmission electron microscopy and diffractometry of materials
(2002)
Transmission Electron Microscopy and Diffractometry of Materials
2nd ed. 2002. Corr. 2nd printing edition
by B. Fultz, Brent Fultz, and James M. Howe
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Subjects
Materials, Microscopy, Transmission electron microscopy, X-ray diffractometer, Applied physics & special topics, Testing Of Materials, Electron Microscopy, Science, Science/Mathematics, Nanostructures, Engineering - General, Physics, Diffraction, Imaging, Materials characterization, Spectroscopy, Technology / Material Science, Transmission electron microsco, Electron Microscopes & Microscopy, Material Science| Edition | Availability ↑ |
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1
Transmission Electron Microscopy and Diffractometry of Materials
March 14, 2005, Springer
Hardcover
in English
- 2nd ed. 2002. Corr. 2nd printing edition
3540437649 9783540437642
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2
Transmission electron microscopy and diffractometry of materials
2002, Springer
in English
- 2nd ed.
3540437649 9783540437642
|
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|
Book Details
First Sentence
"Materials are made of atoms."
The Physical Object
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| July 30, 2019 | Edited by MARC Bot | associate edition with work OL9078318W |
| December 3, 2010 | Edited by Open Library Bot | Added subjects from MARC records. |
| December 10, 2009 | Created by WorkBot | add works page |